Editor/Associate Editor
- 2021 Topic Editor of Electronics (MDPI)
- 2020 Associate Editor of Journal of Functional Materials and Chemical Engineering (JFMCE)- Frontier Scientific and Academic Publishing (FSAPub)
- 2020 Guest Editor of Special Issue of Energies “Battery Storage Technology for a Sustainable Future-MDPI”
- 2020 Associate Editor of Thin Solid Films (Frontiers in Materials)
- 2020 Editor of International Journal of Nanotechnology
- 2019 Guest Editor of 9th Ieee International Nanoelectronic Conference (INEC) 2019
- 2019 Guest Editor of Special Issue of Applied Sciences “Reliability Analysis of Electrotechnical Devices-MDPI”
- 2018 Editor of Energies (MDPI)
- 2017 Associate Editor of Microelectronic Reliability
- 2017 Guest Editor, Energies Journal
- 2016 Editor of Scientific Report, Nature Publishing Group
- 2013 Editor of IEEE Transaction on Devices and Materials Reliability
- 2013 Series Editor of SpringerBrief on Reliability
- 2011-2012 Guest Editor of Nanoscale Research Letter
- 2011-2012 Guest Editor of Microelectronic Reliability
- 2011-2012 Guest Editor of Microelectronic Reliability
- 2010-2012 Associate Editor of GSTF International Journal on Computing
- 2007-2008 Guest Editor of Special Issue of the International J. of Nanotechnology
Reviewer
- 2011-2014 Reviewer for IEEE Trans.on Electron Devices
- 2009-2014 Reviewer for IEEE Trans on Device and Material Reliability
- 2009-now Reviewer for Microelectronics Reliability
- 2004-2014 Reviewer for IEEE Transaction on Nanotechnology
- 2009 Reviewer for IEEE Transaction on VLSI Systems
- 2009 Reviewer for International Journal on Production Economics
- 2005 Member of Review Board for IEEE IRPS
- 2006 Reviewer for Electrochemical and Solid State Lett.
- 2006 Reviewer for IEEE Trans. On Education
- 2005 Reviewer for IEEE Trans. on Semiconductor Manufacturing; IJQRM
- 2005 Reviewer for International conference on Materials for Advanced Technology (ICMAT)
- 2005 Reviewer for Material Research Society Symposium (MRS Spring Conference)
- 2003 Reviewer for International Journal on Quality and Reliability Management (IJQRM)
- 2003 Reviewer for Thin solid films
- 2002 Reviewer for IPFA
- 2001 Reviewers for IEEE PEDS
Award
Top Reviewer of the Year 2011 for Microelectronics Reliability, 2011
He is awarded Top Reviewer by two Editors in Chief (Dr. Nino Stojadinovic and Dr. Michael Pecht) of Microelectronic Reliability recently due to his rigorousness in the review process and provides valuable critical remarks to authors that significantly enhanced the quality of the Journal.