Editor/Associate Editor



Top Reviewer of the Year 2011 for Microelectronics Reliability, 2011 

He is awarded Top Reviewer by two Editors in Chief (Dr. Nino Stojadinovic and Dr. Michael Pecht) of Microelectronic Reliability recently due to his rigorousness in the review process and provides valuable critical remarks to authors that significantly enhanced the quality of the Journal.

Scroll to Top