Background information

Dr. Tan Cher Ming 陳始明 教授

國際頂尖 可靠度專家

Present Appointment:
Center for Reliability Sciences and Technologies, Director Department of Electronic Engineering, Professor

Division: Electronic Engineering Department

Current employer: Chang Gung University

Academic Qualifications:
  • 1980-1984 B.Eng (1st Class Honor) – National University of Singapore
  • 1986-1987 M.A.Sc – University of Toronto
  • 1987-1992 Ph.D – University of Toronto

Cher Ming Tan / 陳始明 (M’84–SM’99) received the Ph.D. degree in electrical engineering from the University of Toronto, Toronto, ON, Canada, in 1992. He has ten years of working experiences in reliability in electronic industry (both in Singapore and Taiwan) before joining Nanyang Technological University (NTU), Singapore, where he was a Faculty Member since in 1996. He has published more than 400 international journal and conference papers and holds twelve patents and one copyright for reliability software. He has given 16 keynote talks and more than 60 invited talks in international conferences. He has written six books and five book chapters in the field of reliability. His research interests include reliability and failure physics modeling of electronic components and systems, finite-element modeling of materials degradation, statistical modeling of engineering systems, nanomaterials and devices reliability, and prognosis and health management of engineering system. He was the Chair of IEEE Singapore Section, Founding Chair of IEEE Nanotechnology Chapter—Singapore Section, Director of SIMTech-NTU Reliability Laboratory, and a Senior Scientist in SIMTech.  He is currently a Senior Member of the American Society for Quality, a Distinguished Lecturer of the IEEE Electronic Device Society on reliability, a Fellow of The Institution of Engineers Singapore, a Fellow and an Executive Council Member of Singapore Quality Institute, the. He is an Editor of the IEEE Transactions on Device and Materials Reliability; Editor of Scientific Report, Nature Publishing; Editor of MDPI Journals; Editor of Frontier in Materials; Associate Editor of Microelectronics Reliability; Guest Editor of the International Journal of Nanotechnology and Nanoscale Research Letters. He is also the Series Editor of SpringerBriefs in Reliability and Advisory Panel member of Elsevier Publisher.  He is among the top 2% scientists in the world in 2020~2022 as published by Stanford University.

Scroll to Top