C. M. Tan, N. Raghavan, and A. Roy. “Application of Gamma Distribution in Electromigration for Submicron Interconnects,” Journal of Applied Physics, vol. 102, no. 10, pp. 103703, 2007
https://aip.scitation.org/doi/full/10.1063/1.2809449
C. M. Tan, N. Raghavan, and A. Roy. “Application of Gamma Distribution in Electromigration for Submicron Interconnects,” Journal of Applied Physics, vol. 102, no. 10, pp. 103703, 2007
https://aip.scitation.org/doi/full/10.1063/1.2809449