Skip to content

Dr. Cher Ming Tan

Professor, CGU, Director, CReST Center

Home
DR. CHER MING TAN
NEWS
PUBLICATION
SERVICES
CONTACT

Dr. Cher Ming Tan

Professor, CGU, Director, CReST Center

Home
DR. CHER MING TAN
NEWS
PUBLICATION
SERVICES
CONTACT

Home
BLOG
Memory

Memory

Analytical modeling electrical conduction in resistive-switching memory through current-limiting-friendly combination frameworks,

Analytical modeling electrical conduction in resistive-switching memory through current-limiting-friendly combination frameworks, Read More »

Search for:

Publication Categories

BOOKS
BOOKS CHAPTER
CONFERENCE PAPERS
JOURNAL PAPERS

Tag

Battery Devices Reliability Electromagnetics Failure Analysis General Reliability Integrated Circuit Reliability Interconnects Reliability LED Reliability Memory Nanotechnology Others Predictive Maintenance Predictive Maintenance/ Prognosis and Health Mgt Prognosis and Health Mgt Quality Quantitative Service Reliability Assessment on Single and Multi Layer Networks Radiation Reliability Statistics Remanufacturing Theory and Practice of Quality and Reliability Engineering in Asia Industry Wafer Bonding

Recent Posts

Professor Tan Cher Ming has been selected (World’s Top 2% Scientists) for three consecutive years
Non-invasive Glucose monitoring system
3D Electromigration Modelling for VLSI.” 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology
Compositionally engineered vacancy-ordered double-perovskite nanocrystals for photovoltaic application
Investigation of the reliability of nano-nickel/niobium oxide-based multilayer thin films deposited on polymer substrates for flexible electronic applications

Subscribe

Enter your email address to subscribe the site and receive notifications of new posts by email.

Email Address

Cher Ming Tan

Cher Ming Tan

RSS - Posts

Copyright © 2024 Dr. Cher Ming Tan | Powered by AutoPress

Scroll to Top