Electromagnetic Induced Failure in GaN-HEMT High Frequency Power Amplifier JOURNAL PAPERS Electromagnetic Induced Failure in GaN-HEMT High Frequency Power Amplifier Read More »
Failure Mechanisms of GaN Transistors in High Power Integrated Circuits CONFERENCE PAPERS Failure Mechanisms of GaN Transistors in High Power Integrated Circuits Read More »
EOS Failure Analysis and Root Cause Identification of Schottky Barrier Rectifiers through Finite Element Modelling CONFERENCE PAPERS EOS Failure Analysis and Root Cause Identification of Schottky Barrier Rectifiers through Finite Element Modelling Read More »
Damage Threshold Determination and Non-destructive Identification of Possible Failure Sites in PIN Limiter JOURNAL PAPERS Damage Threshold Determination and Non-destructive Identification of Possible Failure Sites in PIN Limiter Read More »
Finite element modeling of capacitive coupling voltage contrast JOURNAL PAPERS Finite element modeling of capacitive coupling voltage contrast Read More »
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Feasibility study of the application of voltage contrast to printed circuit board JOURNAL PAPERS Feasibility study of the application of voltage contrast to printed circuit board Read More »
Mapping of solder mask covered interconnects on high density printed circuit board CONFERENCE PAPERS Mapping of solder mask covered interconnects on high density printed circuit board Read More »
Investigation of weight-on-wheel switch failure in F-16 aircraft JOURNAL PAPERS Investigation of weight-on-wheel switch failure in F-16 aircraft Read More »
Non-destructive identification of open circuit in wiring on organic substrate with high wiring density covered with solder resist JOURNAL PAPERS Non-destructive identification of open circuit in wiring on organic substrate with high wiring density covered with solder resist Read More »