C. M. Tan, S. Yanuar, and T. C. Chai. “Finite element modeling of capacitive coupling voltage contrast,” in European Symp. on Reliability of Electron Devices, Failure physics and analysis, 2007.
C. M. Tan, S. Yanuar, and T. C. Chai. “Finite element modeling of capacitive coupling voltage contrast,” in European Symp. on Reliability of Electron Devices, Failure physics and analysis, 2007.