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Blech effect in Cu interconnects with oxide and low-k dielectrics CONFERENCE PAPERS Blech effect in Cu interconnects with oxide and low-k dielectrics Read More »
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Reverse breakdown voltage measurement for power P+NN+ rectifier JOURNAL PAPERS Reverse breakdown voltage measurement for power P+NN+ rectifier Read More »
Root cause analysis based maintenance policy JOURNAL PAPERS Root cause analysis based maintenance policy Read More »
Unveiling the electromigration physics of ULSI interconnects through statistics JOURNAL PAPERS Unveiling the electromigration physics of ULSI interconnects through statistics Read More »
The physical limit and manufacturability of power diode with carrier lifetime control CONFERENCE PAPERS The physical limit and manufacturability of power diode with carrier lifetime control Read More »
