Degradation mechanisms in gate-all-around silicon Nanowire field effect transistor under electrostatic discharge stress – a modeling approach JOURNAL PAPERS Degradation mechanisms in gate-all-around silicon Nanowire field effect transistor under electrostatic discharge stress – a modeling approach Read More »
Rapid ULSI Interconnect Reliability Analysis Using Neural Networks JOURNAL PAPERS Rapid ULSI Interconnect Reliability Analysis Using Neural Networks Read More »
ffects of carbon loading on the performance of functionalized carbon nanotube polymer heat sink for high power light-emitting diode in switching applications JOURNAL PAPERS ffects of carbon loading on the performance of functionalized carbon nanotube polymer heat sink for high power light-emitting diode in switching applications Read More »
Real Time Monitoring and Characterizing of Li-ion Batteries Aging CONFERENCE PAPERS Real Time Monitoring and Characterizing of Li-ion Batteries Aging Read More »
Effects of carbon loading on the performance of functionalized carbon nanotube polymer heat sink for high power light-emitting diode in switching applications JOURNAL PAPERS Effects of carbon loading on the performance of functionalized carbon nanotube polymer heat sink for high power light-emitting diode in switching applications Read More »
Modeling and Analysis of Gate-All-Around Silicon Nanowire FET CONFERENCE PAPERS Modeling and Analysis of Gate-All-Around Silicon Nanowire FET Read More »
Reliability Evaluation and Improvement for High Power LED Driver CONFERENCE PAPERS Reliability Evaluation and Improvement for High Power LED Driver Read More »
ESD Degradation Modeling of Gate-All-Around Silicon Nanowire Device CONFERENCE PAPERS ESD Degradation Modeling of Gate-All-Around Silicon Nanowire Device Read More »
Monte Carlo simulation of fatigue crack initiation at elevated temperature CONFERENCE PAPERS Monte Carlo simulation of fatigue crack initiation at elevated temperature Read More »
Systematic root cause analysis for GaP green light LED degradation JOURNAL PAPERS Systematic root cause analysis for GaP green light LED degradation Read More »