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Dr. Cher Ming Tan

Professor, CGU, Director, CReST Center

  • DR. CHER MING TAN
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Dr. Cher Ming Tan

Professor, CGU, Director, CReST Center

  • DR. CHER MING TAN
    • INTRODUCTION
    • ADMINISTRATIVE ROLES
    • ROLES IN PROFESSIONAL SOCIETIES
    • EDITORIALSHIP
    • RESEARCH
    • TEACHING
    • AWARD
    • RECOGNITIONS
  • NEWS
  • PUBLICATION
  • SERVICES
  • CONTACT
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BOOKS CHAPTER

Component-Level Reliability: Physical Models and Testing Regulations

BOOKS CHAPTER

Component-Level Reliability: Physical Models and Testing Regulations Read More »

Ceramic Integration and Joining Technologies: From Macro to Nanoscale

BOOKS CHAPTER

Ceramic Integration and Joining Technologies: From Macro to Nanoscale Read More »

Changing Reliability Physics of Interconnect from Micro- to Nanotechnology

BOOKS CHAPTER

Changing Reliability Physics of Interconnect from Micro- to Nanotechnology Read More »

Integrated Circuits, Photodiodes and Organic Field Effect Transistors

BOOKS CHAPTER

Integrated Circuits, Photodiodes and Organic Field Effect Transistors Read More »

Simulated Annealing for Mixture Distribution Analysis and its Applications to Reliability Testing

BOOKS CHAPTER

Simulated Annealing for Mixture Distribution Analysis and its Applications to Reliability Testing Read More »

Tag

Battery Devices Reliability Electromagnetics Failure Analysis General Reliability Integrated Circuit Reliability Interconnects Reliability LED Reliability Memory Nanotechnology Others Predictive Maintenance Predictive Maintenance/ Prognosis and Health Mgt Prognosis and Health Mgt Quality Quantitative Service Reliability Assessment on Single and Multi Layer Networks Radiation Reliability Statistics Remanufacturing Theory and Practice of Quality and Reliability Engineering in Asia Industry Wafer Bonding

Recent Posts

  • Professor Tan Cher Ming Recognized as 2024 Top Scholar by ScholarGPS
  • Professor Tan Cher Ming has been selected (World’s Top 2% Scientists) for three consecutive years
  • Non-invasive Glucose monitoring system
  • 3D Electromigration Modelling for VLSI.” 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology
  • Compositionally engineered vacancy-ordered double-perovskite nanocrystals for photovoltaic application

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