JOURNAL PAPERS Modeling and analysis of gate-all-around silicon nanowire FET Bya0938724577 July 25, 2014
JOURNAL PAPERS A practical framework of electrical based online state-of-charge estimation of lithium ion batteries Bya0938724577 June 25, 2014
JOURNAL PAPERS Time Evolution Degradation Physics in High Power White LEDs Under High Temperature-Humidity Conditions Bya0938724577 June 25, 2014
CONFERENCE PAPERS Extending electromigration modeling from test structures to Integrated circuit layout level Byidiotj2002dm June 1, 2014
JOURNAL PAPERS Damage Threshold Determination and Non-destructive Identification of Possible Failure Sites in PIN Limiter Bya0938724577 May 25, 2014
JOURNAL PAPERS Maintenance Scheduling of Plasma Etching Chamber in Wafer Fabrication for high yield etching process Bya0938724577 May 25, 2014
JOURNAL PAPERS Degradation mechanisms in gate-all-around silicon Nanowire field effect transistor under electrostatic discharge stress – a modeling approach Bya0938724577 April 25, 2014
JOURNAL PAPERS Rapid ULSI Interconnect Reliability Analysis Using Neural Networks Bya0938724577 March 25, 2014March 4, 2021
JOURNAL PAPERS ffects of carbon loading on the performance of functionalized carbon nanotube polymer heat sink for high power light-emitting diode in switching applications Bya0938724577 November 25, 2013
CONFERENCE PAPERS Real Time Monitoring and Characterizing of Li-ion Batteries Aging Byidiotj2002dm November 11, 2013