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Dr. Cher Ming Tan

Professor, CGU, Director, CReST Center

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Dr. Cher Ming Tan

Professor, CGU, Director, CReST Center

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DR. CHER MING TAN
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CONTACT

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Electromagnetic Induced Failure in GaN-HEMT High Frequency Power Amplifier

Electromagnetic Induced Failure in GaN-HEMT High Frequency Power Amplifier Read More »

Analytical modeling electrical conduction in resistive-switching memory through current-limiting-friendly combination frameworks,

Analytical modeling electrical conduction in resistive-switching memory through current-limiting-friendly combination frameworks, Read More »

Accurate Real Time On-Line Estimation of State-of-Health and Remaining Useful Life of Li ion Batteries.

Accurate Real Time On-Line Estimation of State-of-Health and Remaining Useful Life of Li ion Batteries. Read More »

Optimization of a T-Shaped MIMO Antenna for Reduction of EMI.

Optimization of a T-Shaped MIMO Antenna for Reduction of EMI. Read More »

Moisture Resistance Evaluation on Single Electronic Package Moulding Compound

Moisture Resistance Evaluation on Single Electronic Package Moulding Compound Read More »

Evaluate The Equivalence On Let Spectra Between Neutron And Proton For Radiation Realibility Testing

CONFERENCE PAPERS

Evaluate The Equivalence On Let Spectra Between Neutron And Proton For Radiation Realibility Testing Read More »

Evaluation of the Potential Electromagnetic Interference in Vertically Stacked 3D Integrated Circuits

Evaluation of the Potential Electromagnetic Interference in Vertically Stacked 3D Integrated Circuits Read More »

Investigate the Equivalence of Neutrons and Protons in Single Event Effects Testing: A Geant4 Study

Chiang, Y.; Tan, C.M.; Chao, T.-C.; Lee, C.-C.; Tung, C.-J. Investigate the Equivalence of Neutrons and Protons in Single Event Effects Testing: A Geant4 Study. Appl. Sci. 2020, 10, 3234.

Investigate the Equivalence of Neutrons and Protons in Single Event Effects Testing: A Geant4 Study Read More »

Assessing Multi-Output Gaussian Process Regression for Modeling of Non-Monotonic Degradation Trends of Light Emitting Diodes in Storage

Assessing Multi-Output Gaussian Process Regression for Modeling of Non-Monotonic Degradation Trends of Light Emitting Diodes in Storage Read More »

Assessing Multi-Output Gaussian Process Regression for Modeling of Non-Monotonic Degradation Curves of Light Emitting Diodes in Storage

CONFERENCE PAPERS

Assessing Multi-Output Gaussian Process Regression for Modeling of Non-Monotonic Degradation Curves of Light Emitting Diodes in Storage Read More »

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Battery Devices Reliability Electromagnetics Failure Analysis General Reliability Integrated Circuit Reliability Interconnects Reliability LED Reliability Memory Nanotechnology Others Predictive Maintenance Predictive Maintenance/ Prognosis and Health Mgt Prognosis and Health Mgt Quality Quantitative Service Reliability Assessment on Single and Multi Layer Networks Radiation Reliability Statistics Remanufacturing Theory and Practice of Quality and Reliability Engineering in Asia Industry Wafer Bonding

Recent Posts

Professor Tan Cher Ming has been selected (World’s Top 2% Scientists) for three consecutive years
Non-invasive Glucose monitoring system
3D Electromigration Modelling for VLSI.” 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology
Compositionally engineered vacancy-ordered double-perovskite nanocrystals for photovoltaic application
Investigation of the reliability of nano-nickel/niobium oxide-based multilayer thin films deposited on polymer substrates for flexible electronic applications

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