Udit Narula, Cher Ming Tan, “Challenges in Reliability Screening for High Power Diodes”, 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2017), Chengdu, China, 4-7 July, 2017.
Udit Narula, Cher Ming Tan, “Challenges in Reliability Screening for High Power Diodes”, 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2017), Chengdu, China, 4-7 July, 2017.