F. He and C. M. Tan. “Comparison of electromigration simulation in test structure and actual circuit,” Applied Mathematical Modelling, vol. 36, no. 10, pp. 4908-4917, Oct. 2012
https://www.sciencedirect.com/science/article/pii/S0307904X1100816X
F. He and C. M. Tan. “Comparison of electromigration simulation in test structure and actual circuit,” Applied Mathematical Modelling, vol. 36, no. 10, pp. 4908-4917, Oct. 2012
https://www.sciencedirect.com/science/article/pii/S0307904X1100816X