Cubic Ta diffusion barrier layers for Cu metallization

Z. L. Yuan, D. H. Zhang, C. Y. Li, K. Prasad, C. M. Tan, Y. J. Yuan, P. W. Lu, R. Kumar, and P. D. Foo. “Cubic Ta diffusion barrier layers for Cu metallization,” in 2nd Int. Semiconductor Technology Conf., 2002.

Scroll to Top