C. M. Tan, Z. Gan, W. F. Ho, S. Chen, and R. Liu. “Determination of the dice forward I-V characteristics of a power diode from a packaged device and its applications,” Microelectronics Reliability, vol. 45, no. 1, pp. 179-184, 2005
https://www.sciencedirect.com/science/article/pii/S0026271404001489