C. M. Tan, W. Li, K. T. Tan, and F. Low. “Development of highly accelerated electromigration test,” in European Symp. on Reliability of Electron Devices, Failure physics and analysis, 2006.
C. M. Tan, W. Li, K. T. Tan, and F. Low. “Development of highly accelerated electromigration test,” in European Symp. on Reliability of Electron Devices, Failure physics and analysis, 2006.