G. Huang and C. M. Tan. “Device temperature and stress distributions in power diode – a finite element method,” in Int. Conf. on power electronics and drive systems, 2005, pp. 700-703.
G. Huang and C. M. Tan. “Device temperature and stress distributions in power diode – a finite element method,” in Int. Conf. on power electronics and drive systems, 2005, pp. 700-703.