W. Li and C. M. Tan. “Enhanced finite element modelling of Cu electromigration using ANSYS and Matlab,” in European Symp. on Reliability of Electron Devices, Failure physics and analysis, 2007.
W. Li and C. M. Tan. “Enhanced finite element modelling of Cu electromigration using ANSYS and Matlab,” in European Symp. on Reliability of Electron Devices, Failure physics and analysis, 2007.