Cher Ming Tan, “Extending electromigration modeling from test structures to Integrated circuit layout level”, Invited talk in International Reliability Physics Symposium, HI USA, 01-05 Jun., 2014.
Cher Ming Tan, “Extending electromigration modeling from test structures to Integrated circuit layout level”, Invited talk in International Reliability Physics Symposium, HI USA, 01-05 Jun., 2014.