Vivek Sangwan, Dipesh Kapoor, Cher Ming Tan,” Failure Mechanisms of GaN Transistors in High Power Integrated Circuits”, 第18台灣靜電放電防護技術暨可靠度技術研討會 (2019 Taiwan ESD and Reliability Conference), Hsinchu, Taiwan, 6-8th November 2019.
Vivek Sangwan, Dipesh Kapoor, Cher Ming Tan,” Failure Mechanisms of GaN Transistors in High Power Integrated Circuits”, 第18台灣靜電放電防護技術暨可靠度技術研討會 (2019 Taiwan ESD and Reliability Conference), Hsinchu, Taiwan, 6-8th November 2019.