K. P. Lim, J. Lim, C. M. Tan, and T. C. Chai. “Feasibility of capacitive coupling voltage contrast (CCVC) for the failure analysis of advanced printed circuit board,” in Symp. of Microelectronics, 2005.
K. P. Lim, J. Lim, C. M. Tan, and T. C. Chai. “Feasibility of capacitive coupling voltage contrast (CCVC) for the failure analysis of advanced printed circuit board,” in Symp. of Microelectronics, 2005.