J. Liao, C. M. Tan and G. Spierings. “Hot carrier reliability of power SOI EDNMOS,” IEEE Transactions on Power Electronics, vol. 25, no. 7, pp. 1685-91, 2010
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5398913
J. Liao, C. M. Tan and G. Spierings. “Hot carrier reliability of power SOI EDNMOS,” IEEE Transactions on Power Electronics, vol. 25, no. 7, pp. 1685-91, 2010
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5398913