Asenov A, Schlichtmann U.M. Cher Ming Tan, Hei Wong and Zhou Xing, “ICMAT 2011 – Reliability and variability of semiconductor devices and ICs”, Microelectronics Reliability, v 52(8), p. 1531, August 2012.
Asenov A, Schlichtmann U.M. Cher Ming Tan, Hei Wong and Zhou Xing, “ICMAT 2011 – Reliability and variability of semiconductor devices and ICs”, Microelectronics Reliability, v 52(8), p. 1531, August 2012.