C. M. Tan. “Identifying key parameters for risk based inspections (RBI) and failure mode effect analysis (FMEA) (invited),” presented at Int. Quality and Process control Conf., Bangkok, Jan. 2004.
C. M. Tan. “Identifying key parameters for risk based inspections (RBI) and failure mode effect analysis (FMEA) (invited),” presented at Int. Quality and Process control Conf., Bangkok, Jan. 2004.