Yizhen Tian*, Feifei He, Qi-Jun Zhang, Cher Ming Tan, Jianguo Ma, “Rapid ULSI Interconnect Reliability Analysis Using Neural Networks,” IEEE Trans. On Devices and Materials Reliability, vol. 14, issue 1, pp. 400-407, March, 2014.
https://ieeexplore.ieee.org/abstract/document/6469205