N. Raghavan and C. M. Tan. “Statistical analysis of multi-censored electromigration data using the EM algorithm,” in Int. Symp. on physical and failure analysis of integrated circuits, 2007.
N. Raghavan and C. M. Tan. “Statistical analysis of multi-censored electromigration data using the EM algorithm,” in Int. Symp. on physical and failure analysis of integrated circuits, 2007.