Modeling the effect of barrier thickness and low-k dielectric on circuit reliability using 3D model JOURNAL PAPERS Modeling the effect of barrier thickness and low-k dielectric on circuit reliability using 3D model Read More »
3D circuit model for 3D IC reliability study (invited) CONFERENCE PAPERS 3D circuit model for 3D IC reliability study (invited) Read More »
Predicting Integrated Circuit Reliability from Wafer Fabrication Technology Reliability Data CONFERENCE PAPERS Predicting Integrated Circuit Reliability from Wafer Fabrication Technology Reliability Data Read More »