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Electromigration in ULSI Interconnects JOURNAL PAPERS Electromigration in ULSI Interconnects Read More »
Application of Gamma Distribution in Electromigration for Submicron Interconnects JOURNAL PAPERS Application of Gamma Distribution in Electromigration for Submicron Interconnects Read More »
Lifetime modeling for stress-induced voiding in integrated circuit interconnections JOURNAL PAPERS Lifetime modeling for stress-induced voiding in integrated circuit interconnections Read More »
Dynamic simulation of electromigration in polycrystalline interconnect thin film using combined Monte Carlo algorithm and finite element modeling JOURNAL PAPERS Dynamic simulation of electromigration in polycrystalline interconnect thin film using combined Monte Carlo algorithm and finite element modeling Read More »
Probing into the asymmetric nature of electromigration performance of submicron interconnect via structure JOURNAL PAPERS Probing into the asymmetric nature of electromigration performance of submicron interconnect via structure Read More »
Blech effect in Cu interconnects with oxide and low-k dielectrics CONFERENCE PAPERS Blech effect in Cu interconnects with oxide and low-k dielectrics Read More »
Electromigration in ULSI Interconnection (keynote) CONFERENCE PAPERS Electromigration in ULSI Interconnection (keynote) Read More »
Enhanced finite element modelling of Cu electromigration using ANSYS and Matlab CONFERENCE PAPERS Enhanced finite element modelling of Cu electromigration using ANSYS and Matlab Read More »
Revisit to the finite element modeling of electromigration for narrow interconnects JOURNAL PAPERS Revisit to the finite element modeling of electromigration for narrow interconnects Read More »