Y. Hou and C.M. Tan. “Transient electrical thermal analysis of ESD process using 3-D finite element method,” in 12th IEEE Int. Symp. on Integrated Circuits, Singapore, 2009.
Y. Hou and C.M. Tan. “Transient electrical thermal analysis of ESD process using 3-D finite element method,” in 12th IEEE Int. Symp. on Integrated Circuits, Singapore, 2009.