S. Y. Lim, C. M. Tan, K. Prasad, and D. H. Zhang. “Uncover the diffusion mechanism of atoms during electromigration test using non-stationary noise analysis,” in 6th Int. Conf. on Solid-state and integrated circuit Technology, 2001, pp. 921.
S. Y. Lim, C. M. Tan, K. Prasad, and D. H. Zhang. “Uncover the diffusion mechanism of atoms during electromigration test using non-stationary noise analysis,” in 6th Int. Conf. on Solid-state and integrated circuit Technology, 2001, pp. 921.