Device level electrical-thermal-stress coupled-field modeling JOURNAL PAPERS Device level electrical-thermal-stress coupled-field modeling Read More »
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A comprehensive semi-empirical mobility model for strained-Si N-MOSFETs CONFERENCE PAPERS A comprehensive semi-empirical mobility model for strained-Si N-MOSFETs Read More »
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A cost model for the predictive maintenance policy of a multi-state system CONFERENCE PAPERS A cost model for the predictive maintenance policy of a multi-state system Read More »
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Stress migration reliability of wide Cu interconnects with Gouging Vias CONFERENCE PAPERS Stress migration reliability of wide Cu interconnects with Gouging Vias Read More »
Is electron wind force the sole driving force in electromingration of ULSI interconnection? (invited) CONFERENCE PAPERS Is electron wind force the sole driving force in electromingration of ULSI interconnection? (invited) Read More »
