Effectiveness of Reservoir Length on Electromigration lifetime enhancement for ULSI Interconnects with advanced technology nodes (Invited Talk) CONFERENCE PAPERS Effectiveness of Reservoir Length on Electromigration lifetime enhancement for ULSI Interconnects with advanced technology nodes (Invited Talk) Read More »
Degradation behavior of high power light emitting diode under high frequency switching JOURNAL PAPERS Degradation behavior of high power light emitting diode under high frequency switching Read More »
Comparison of electromigration simulation in test structure and actual circuit JOURNAL PAPERS Comparison of electromigration simulation in test structure and actual circuit Read More »
Reliability study of LED driver – a case study of black box testing JOURNAL PAPERS Reliability study of LED driver – a case study of black box testing Read More »
Strategy for TSV scaling with consideration on thermo-mechanical stress and acceptable delay CONFERENCE PAPERS Strategy for TSV scaling with consideration on thermo-mechanical stress and acceptable delay Read More »
Reliability study of LED driver – a case study of black box testing CONFERENCE PAPERS Reliability study of LED driver – a case study of black box testing Read More »
Degradation behaviour of high power light emitting diode under high frequency switching CONFERENCE PAPERS Degradation behaviour of high power light emitting diode under high frequency switching Read More »
TSV scaling with constant liner thickness and the related implications on thermo-mechanical stress, capacitance, and leakage current CONFERENCE PAPERS TSV scaling with constant liner thickness and the related implications on thermo-mechanical stress, capacitance, and leakage current Read More »
Effect of Ni-Coated Carbon Nanotubes on Interfacial Reaction and Shear Strength of Sn-Ag-Cu Solder Joints JOURNAL PAPERS Effect of Ni-Coated Carbon Nanotubes on Interfacial Reaction and Shear Strength of Sn-Ag-Cu Solder Joints Read More »
Recent Development of Reliability and Maintenance (Invited Talk) CONFERENCE PAPERS Recent Development of Reliability and Maintenance (Invited Talk) Read More »