Prompt gamma imaging is one of the emerging techniques used in proton therapy for in-vivo range verification. Prompt gamma signals are generated during therapy due to the nuclear interaction between beam particles and nuclei of the tissue that is detected and processed in order to obtain the position and energy of the event so that […]

Neutron radiation on advanced integrated circuits (ICs) is becoming important for their reliable operation. However, a neutron test on ICs is expensive and time-consuming. In this work, we employ Monte Carlo simulation to examine if a proton test can replace or even accelerate the neutron test, and we found that 200 MeV protons are the

Single event upset, or Single Event Effect (SEE) is increasingly important as semiconductor devices are entering into nano-meter scale. The Linear Energy Transfer (LET) concept is commonly used to estimate the rate of SEE. The SEE, however, should be related to energy deposition of each stochastic event, but not LET which is a non-stochastic quantity.

When several units failed during operation or reliability test, and their failure modes are the same, it is difficult to examine if there are multiple failure mechanisms unless destructive analysis is performed on every units. However, this can be very time and resource consuming. This work demonstrates a method that combine statistical method and non-destructive