CONFERENCE PAPERS Device temperature and stress distributions in power diode – a finite element method Byidiotj2002dm January 1, 2005
CONFERENCE PAPERS Reliability screening through electrical testing for press-fit alternator power diode in automotive application Byidiotj2002dm January 1, 2005
CONFERENCE PAPERS Non-destructive identification of open circuit in wiring on organic substrate with high wiring density covered with solder resist Byidiotj2002dm January 1, 2005
CONFERENCE PAPERS Determining maintenance strategy from root cause analysis and reliability data analysis (invited) Byidiotj2002dm June 1, 2004
JOURNAL PAPERS Intrinsic mechanical properties of diamond-like carbon thin films deposited by filtered cathodic vacuum arc Bya0938724577 February 25, 2004
JOURNAL PAPERS Reliability improvement in Al metallization: a combination of statistical prediction and failure analytical methodology Bya0938724577 February 25, 2004
JOURNAL PAPERS Influence of applied load on vacuum wafer bonding at low temperature Bya0938724577 February 25, 2004
JOURNAL PAPERS Thermally induced stress in partial SOI structure during high temperature processing Bya0938724577 February 25, 2004