C. M. Tan and Z. Gan. “Effectiveness of delta VF test to detect solder integrity in power diode,” in Int. Conf. on Power Electronics and Drive Systems, 2003, pp. 38-42.
C. M. Tan and Z. Gan. “Effectiveness of delta VF test to detect solder integrity in power diode,” in Int. Conf. on Power Electronics and Drive Systems, 2003, pp. 38-42.