G. Zhang and C. M. Tan. “Selection of failure time within test time interval for group reliability data analysis,” in IEEE Canadian Conf. on Electrical and Computing Engineering, 2000, pp. 98-102.
G. Zhang and C. M. Tan. “Selection of failure time within test time interval for group reliability data analysis,” in IEEE Canadian Conf. on Electrical and Computing Engineering, 2000, pp. 98-102.