Determination of the dice forward I-V characteristics of a power diode from a packaged device and its applications CONFERENCE PAPERS Determination of the dice forward I-V characteristics of a power diode from a packaged device and its applications Read More »
Finite element modeling of internal mechanical stress in partial SOI structure during wafer bonding processing CONFERENCE PAPERS Finite element modeling of internal mechanical stress in partial SOI structure during wafer bonding processing Read More »
Temperature and stress distribution in the SOI structure during fabrication JOURNAL PAPERS Temperature and stress distribution in the SOI structure during fabrication Read More »
Improving the reverse blocking capability of carrier stored trench-gate bipolar transistor CONFERENCE PAPERS Improving the reverse blocking capability of carrier stored trench-gate bipolar transistor Read More »
Effectiveness of delta VF test to detect solder integrity in power diode CONFERENCE PAPERS Effectiveness of delta VF test to detect solder integrity in power diode Read More »
Using power diode models for circuit simulations – a comprehensive review JOURNAL PAPERS Using power diode models for circuit simulations – a comprehensive review Read More »
Thermal stress distribution in the SOI structure CONFERENCE PAPERS Thermal stress distribution in the SOI structure Read More »