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Dr. Cher Ming Tan

Professor, CGU, Director, CReST Center

  • INDEX
  • DR. CHER MING TAN
    • INTRODUCTION
    • ADMINISTRATIVE ROLES
    • ROLES IN PROFESSIONAL SOCIETIES
    • EDITORIALSHIP
    • RESEARCH
    • TEACHING
    • AWARD
    • RECOGNITIONS
  • NEWS
  • PUBLICATION
  • SERVICES
  • CONTACT
Dr. Cher Ming Tan

Professor, CGU, Director, CReST Center

  • INDEX
  • DR. CHER MING TAN
    • INTRODUCTION
    • ADMINISTRATIVE ROLES
    • ROLES IN PROFESSIONAL SOCIETIES
    • EDITORIALSHIP
    • RESEARCH
    • TEACHING
    • AWARD
    • RECOGNITIONS
  • NEWS
  • PUBLICATION
  • SERVICES
  • CONTACT

Reliabiilty Analysis and Application with MATLAB (invited)

CONFERENCE PAPERS

Reliabiilty Analysis and Application with MATLAB (invited) Read More »

Building empirical model through simulation a case study

CONFERENCE PAPERS

Building empirical model through simulation a case study Read More »

Silicon-to-silicon wafer bonding by tempered sol-gel intermediate layer

CONFERENCE PAPERS

Silicon-to-silicon wafer bonding by tempered sol-gel intermediate layer Read More »

Identifying key parameters for risk based inspections (RBI) and failure mode effect analysis (FMEA) (invited)

CONFERENCE PAPERS

Identifying key parameters for risk based inspections (RBI) and failure mode effect analysis (FMEA) (invited) Read More »

Application of FMEA for build-in reliability and maintenance (invited)

CONFERENCE PAPERS

Application of FMEA for build-in reliability and maintenance (invited) Read More »

Finite element modeling of internal mechanical stress in partial SOI structure during wafer bonding processing

CONFERENCE PAPERS

Finite element modeling of internal mechanical stress in partial SOI structure during wafer bonding processing Read More »

Non-destructive void size determination in copper metallization under passivation

JOURNAL PAPERS

Non-destructive void size determination in copper metallization under passivation Read More »

Temperature and stress distribution in the SOI structure during fabrication

JOURNAL PAPERS

Temperature and stress distribution in the SOI structure during fabrication Read More »

A new method for deposition of cubic Ta diffusion barrier for Cu metallization

JOURNAL PAPERS

A new method for deposition of cubic Ta diffusion barrier for Cu metallization Read More »

Failure mechanisms of aluminum bond pad peeling during thermosonic bonding

JOURNAL PAPERS

Failure mechanisms of aluminum bond pad peeling during thermosonic bonding Read More »

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Tag

Battery Devices Reliability Electromagnetics Failure Analysis General Reliability Integrated Circuit Reliability Interconnects Reliability LED Reliability Memory Nanotechnology Others Predictive Maintenance Predictive Maintenance/ Prognosis and Health Mgt Prognosis and Health Mgt Quality Quantitative Service Reliability Assessment on Single and Multi Layer Networks Radiation Reliability Statistics Remanufacturing Theory and Practice of Quality and Reliability Engineering in Asia Industry Wafer Bonding

Recent Posts

  • Professor Tan Cher Ming has been selected (World’s Top 2% Scientists) for three consecutive years
  • Non-invasive Glucose monitoring system
  • 3D Electromigration Modelling for VLSI.” 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology
  • Compositionally engineered vacancy-ordered double-perovskite nanocrystals for photovoltaic application
  • Investigation of the reliability of nano-nickel/niobium oxide-based multilayer thin films deposited on polymer substrates for flexible electronic applications

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