Predicting Integrated Circuit Reliability from Wafer Fabrication Technology Reliability Data CONFERENCE PAPERS Predicting Integrated Circuit Reliability from Wafer Fabrication Technology Reliability Data Read More »
Room temperature observation of point defect on gold surface using thermovoltage mapping CONFERENCE PAPERS Room temperature observation of point defect on gold surface using thermovoltage mapping Read More »
Statistical analysis of multi-censored electromigration data using the EM algorithm CONFERENCE PAPERS Statistical analysis of multi-censored electromigration data using the EM algorithm Read More »
An approach to statistical analysis of gate oxide breakdown mechanisms CONFERENCE PAPERS An approach to statistical analysis of gate oxide breakdown mechanisms Read More »
Dynamic simulation of electromigration in polycrystalline thin film using combined Monte Carlo algorithm and finite element modeling CONFERENCE PAPERS Dynamic simulation of electromigration in polycrystalline thin film using combined Monte Carlo algorithm and finite element modeling Read More »
Development of highly accelerated electromigration test CONFERENCE PAPERS Development of highly accelerated electromigration test Read More »
Experimental investigation on the impact of stress free temperature on the electromigration performance of copper dual damascene submicron interconnect CONFERENCE PAPERS Experimental investigation on the impact of stress free temperature on the electromigration performance of copper dual damascene submicron interconnect Read More »
Mapping of solder mask covered interconnects on high density printed circuit board CONFERENCE PAPERS Mapping of solder mask covered interconnects on high density printed circuit board Read More »
Device level electrical-thermal-stress coupled-field modeling CONFERENCE PAPERS Device level electrical-thermal-stress coupled-field modeling Read More »
A comprehensive semi-empirical mobility model for strained-Si N-MOSFETs CONFERENCE PAPERS A comprehensive semi-empirical mobility model for strained-Si N-MOSFETs Read More »